Title :
(0 570-ps 13-mW Josephson 1-kbit NDRO RAM
Author :
Nagasawa, Shuichi ; Wada, Yoshifusa ; Hidaka, Mutsuo ; Tsuge, Hisanao ; Ishida, Ichiro ; Tahara, Shuichi
Author_Institution :
Microelectron. Res. Labs., NEC Corp., Ibaraki, Japan
fDate :
10/1/1989 12:00:00 AM
Abstract :
Josephson 1-kbit random access memories (RAM´s) have been fabricated using Nb multilayer planarization technology with Nb/AlOx/Nb junctions and Mo resistors. The RAM design has been reported previously. The RAM consists of a 32*32-bit nondestructive readout (NDRO) memory cell array and peripheral circuits. The NDRO memory cell consists of a loop storing three flux quanta and two 3-junction interferometer gates. The peripheral circuits consist of decoders with address inverters, drivers, a sense circuit and reset circuits, where resistor-coupled Josephson logic (RCJL) circuits are used as basic circuits. The RAM circuit size is 4.4*4.4 mm2, and the memory cell size is 65*65 mu m2. About 10000 Nb/AlOx/Nb junctions with 1030-A/cm2 critical current density were contained in the RAM. Minimum line and space widths were 3 and 2 mu m, respectively. The Mo resistors had 1.2 approximately 1.3 Omega sheet resistance. About 40 percent of the bits were successfully operated with a +or-18-percent bias margin. A minimum 570-ps access time with 13-mW power dissipation was obtained for the highest peripheral circuit bias conditions.
Keywords :
Josephson effect; nondestructive readout; random-access storage; superconducting junction devices; superconducting memory circuits; 1 kbit; 13 mW; 3-junction interferometer gates; 570 ps; Mo resistors; NDRO RAM; Nb multilayer planarization technology; Nb-AlOx-Nb superconducting junctions; RCJL; access time; address inverters; decoders; drivers; memory cell array; nondestructive readout; peripheral circuits; power dissipation; random access memories; reset circuits; resistor-coupled Josephson logic; sense circuit; Decoding; Driver circuits; Inverters; Josephson junctions; Niobium; Nonhomogeneous media; Planarization; Random access memory; Read-write memory; Resistors;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1989.572615