Title :
Cause Reduction for Quick Testing
Author :
Groce, Alex ; Alipour, Mohammed Amin ; Chaoqiang Zhang ; Yang Chen ; Regehr, John
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
fDate :
March 31 2014-April 4 2014
Abstract :
In random testing, it is often desirable to produce a "quick test" -- an extremely inexpensive test suite that can serve as a frequently applied regression and allow the benefits of random testing to be obtained even in very slow or over-subscribed test environments. Delta debugging is an algorithm that, given a failing test case, produces a smaller test case that also fails, and typically executes much more quickly. Delta debugging of random tests can produce effective regression suites for previously detected faults, but such suites often have little power for detecting new faults, and in some cases provide poor code coverage. This paper proposes extending delta debugging by simplifying tests with respect to code coverage, an instance of a generalization of delta debugging we call cause reduction. We show that test suites reduced in this fashion can provide very effective quick tests for real-world programs. For Mozilla\´s Spider Monkey JavaScript engine, the reduced suite is more effective for finding software faults, even if its reduced runtime is not considered. The effectiveness of a reduction-based quick test persists through major changes to the software under test.
Keywords :
online front-ends; program debugging; program testing; regression analysis; software fault tolerance; Mozilla; SpiderMonkey JavaScript engine; cause reduction; code coverage; delta debugging; fault detection; quick testing; random testing; reduction-based quick test; regression suites; software faults; software under test; test suites; Computer bugs; Debugging; Educational institutions; Fault detection; Hardware; Minimization; Testing; random testing; regression testing; test case minimization;
Conference_Titel :
Software Testing, Verification and Validation (ICST), 2014 IEEE Seventh International Conference on
Conference_Location :
Cleveland, OH
DOI :
10.1109/ICST.2014.37