Title :
Circuit models and applications of the superconducting field-effect transistor
Author :
Glasser, Lance A.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fDate :
10/1/1989 12:00:00 AM
Abstract :
Static and dynamic models for the superconducting transistor are developed. The models capture the symmetry of the source-drain structure, incorporate the gate reaction, span the long- and short-channel regimes without discontinuity, and are suitable for circuit simulation. The sensitivity of the drain-to-source critical current to changes in gate charge is shown to control much of the device dynamics. The model is used to investigate several circuit configurations including amplifiers, inverters, latches, flux transfer devices, and phase-locked components.
Keywords :
insulated gate field effect transistors; superconducting junction devices; 4.2 K; Si; amplifiers; applications; circuit configurations; circuit models; circuit simulation; device dynamics; drain-to-source critical current; dynamic models; flux transfer devices; gate charge; gate reaction; inverters; latches; long channel regime; phase-locked components; sensitivity; short-channel regimes; source-drain structure; static models; superconducting FET; superconducting field-effect transistor; superconducting transistor; symmetry; Circuit simulation; Critical current; Cryogenics; FETs; High temperature superconductors; Inverters; Latches; MOSFET circuits; Metallization; Superconducting materials; Threshold voltage; Wave functions;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1989.572631