Title :
SimLatte: A Framework to Support Testing for Worst-Case Interrupt Latencies in Embedded Software
Author :
Tingting Yu ; Srisa-an, W. ; Cohen, Morris B. ; Rothermel, Gregg
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of Nebraska, Lincoln, NE, USA
fDate :
March 31 2014-April 4 2014
Abstract :
Embedded systems tend to be interrupt-driven, yet the presence of interrupts can affect system dependability because there can be delays in servicing interrupts. Such delays can occur when multiple interrupt service routines and interrupts of different priorities compete for resources on a given CPU. For this reason, researchers have sought approaches by which to estimate worst-case interrupt latencies (WCILs) for systems. Most existing approaches, however, are based on static analysis. In this paper, we present SIMLATTE, a testing-based approach for finding WCILs. SIMLATTE uses a genetic algorithm for test case generation that converges on a set of inputs and interrupt arrival points that are likely to expose WCILs. It also uses an opportunistic interrupt invocation approach to invoke interrupts at a variety of feasible locations. Our evaluation of SIMLATTE on several non-trivial embedded systems reveals that it is considerably more effective and efficient than random testing. We also determine that the combination of the genetic algorithm and opportunistic interrupt invocation allows SIMLATTE to perform better than it can when using either one in isolation.
Keywords :
embedded systems; genetic algorithms; program diagnostics; CPU; SimLatte; WCIL; embedded software; genetic algorithm; multiple interrupt service routines; nontrivial embedded systems; opportunistic interrupt invocation; random testing; static analysis; support testing; system dependability; test case generation; worst-case interrupt latencies; Biological cells; Delays; Generators; Genetic algorithms; Sociology; Statistics; Testing; Embedded Software; Genetic Algorithm; Interrupt Latencies; Testing;
Conference_Titel :
Software Testing, Verification and Validation (ICST), 2014 IEEE Seventh International Conference on
Conference_Location :
Cleveland, OH
DOI :
10.1109/ICST.2014.44