DocumentCode :
1467689
Title :
On the Ink Jetting of Full Front Ag Gridlines for Cost-Effective Metallization of Si Solar Cells
Author :
Ebong, Abasifreke ; Cooper, Ian B. ; Rounsaville, Brian ; Rohatgi, Ajeet ; Dovrat, Miki ; Kritchman, E. ; Brusilovsky, D. ; Benichou, Axel
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of North Carolina at Charlotte, Charlotte, NC, USA
Volume :
33
Issue :
5
fYear :
2012
fDate :
5/1/2012 12:00:00 AM
Firstpage :
637
Lastpage :
639
Abstract :
In this letter, we report on the ink-jet full gridline cells with three different Ag dosages (70, 90, and 130 mg) on 75-Ω/sq emitters. We observed that the open-circuit voltage (VOC), short-circuit current density (JSC), and fill factor (FF ) were highest for the 130-mg dose and decrease thereafter as the Ag dosage decreases. Because of the decreased FF with decreasing Ag dosage, the efficiency followed the same trend. However, we demonstrated, for the first time, fully ink-jetted front Ag gridlines with an FF of 0.765 and efficiency of 18.4% on 239-cm2 commercial CZ wafers with a sheet resistance of 75 Ω/sq . Noteworthy is the achievement of 17.8% efficiency with only 70 mg of Ag, which is ~ 68% less Ag than that used on cells with screen-printed gridlines. This represents a Ag cost saving of ~ $0.245 per 6-inch wafer compared to the screen-printed counterpart with 220 mg of Ag.
Keywords :
current density; elemental semiconductors; ink jet printing; metallisation; short-circuit currents; silicon; silver; solar cells; Ag; Ag dosages; Ag gridlines; Si; Si solar cells; commercial CZ wafers; cost-effective metallization; ink jetting; open-circuit voltage; screen-printed gridlines; sheet resistance; short-circuit current density; Etching; Glass; Ink; Metallization; Photovoltaic cells; Resistance; Silicon; High-efficiency solar cells; ink-jetted cells; silicon solar cells;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2012.2186553
Filename :
6168215
Link To Document :
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