Title :
Determination of Electrical Contact Resistivity in Thermoelectric Modules (TEMs) From Module-Level Measurements
Author :
Annapragada, S. Ravi ; Salamon, Todd ; Kolodner, Paul ; Hodes, Marc ; Garimella, Suresh V.
Author_Institution :
United Technol. Res. Center, East Hartford, CT, USA
fDate :
4/1/2012 12:00:00 AM
Abstract :
An experimental apparatus was developed to characterize the performance of a thermoelectric module (TEM) and heat sink assembly when the TEM was operated in refrigeration mode. A numerical model was developed to simulate the experiments. Bulk and interfacial Ohmic heating, the Peltier effect, Thomson effect and temperature-dependent bulk material properties, i.e., Seebeck coefficient and electrical conductivity were considered. A novel, self-consistent characterization methodology was developed to obtain the electrical contact resistivity at the interconnects in a TEM from the numerical simulations and the experiments. The electrical contact resistivity of the module tested was determined to be approximately 1.0 × 10-9 Ωm . The predictions are consistent with electrical contact resistivity obtained based on the performance specifications (ΔTmax) of the TEM.
Keywords :
Peltier effect; Thomson effect; electrical contacts; electrical resistivity; level measurement; numerical analysis; ohmic contacts; Peltier effect; Seebeck coefficient; TEM; Thomson effect; electrical conductivity; electrical contact resistivity; heat sink; interfacial ohmic heating; module-level measurements; numerical simulations; temperature-dependent bulk material properties; thermoelectric modules; Conductivity; Contacts; Heat sinks; Resistance; Resistance heating; Temperature measurement; Cooling; electrical contact resistance; thermoelectric module;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2012.2183595