• DocumentCode
    1467865
  • Title

    BIST for D/A and A/D converters

  • Author

    Arabi, Karim ; Kaminska, Bozena ; Rzeszut, Janusz

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ecole Polytech., Montreal, Que., Canada
  • Volume
    13
  • Issue
    4
  • fYear
    1996
  • Firstpage
    40
  • Lastpage
    49
  • Abstract
    The expense of specialized equipment can be a problem in testing high resolution D/A converters. A BIST alternative that tests offset voltage, integral nonlinearity, differential nonlinearity, and gain error without such equipment or the use of a digital signal processor or microcontroller shows promise. We also extend the same technique to test a wide range of A/D converters
  • Keywords
    analogue-digital conversion; built-in self test; digital-analogue conversion; electric potential; A/D converters; BIST; D/A converters; differential nonlinearity; gain error; integral nonlinearity; offset voltage; Analog circuits; Analog-digital conversion; Automatic testing; Built-in self-test; Circuit testing; Costs; Logic testing; Manufacturing; Microcontrollers; Voltage;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.544535
  • Filename
    544535
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1467865