DocumentCode
1468184
Title
Determining mode excitations of vacuum electronics devices via three-dimensional simulations using the SOS code
Author
Warren, Gary
Author_Institution
Mission Res. Corp., Newington, VA, USA
Volume
35
Issue
11
fYear
1988
fDate
11/1/1988 12:00:00 AM
Firstpage
2027
Lastpage
2033
Abstract
Examined the feasibility of determining via simulation the mode excitation behavior of vacuum electronic devices. The SOS code was used to compute the resonance modes (frequency-domain information) of sample devices and separately to compute the transient behavior of the same devices. Then a new code, DOT, to compute appropriate dot products of the time-domain and frequency-domain results and the transient behavior of individual modes in the device. Modes in a coupled-cavity traveling-wave tube (CCTWT) section excited with coaxial E-probes (cable stubs) and with an electron beam were analyzed in separate simulations. The authors examined whether the transient waves were forward or backward waves for each case. Finally, they computed the hot-test mode frequencies of the CCTWT section
Keywords
electron beams; travelling-wave-tubes; vacuum tubes; SOS code; backward waves; coaxial E-probes; coupled-cavity traveling-wave tube; dot products; frequency-domain; frequency-domain information; hot-test mode frequencies; mode excitations; resonance modes; sample devices; three-dimensional simulations; time-domain; transient behavior; vacuum electronics devices; Analytical models; Coaxial cables; Computational modeling; Electron beams; Electron tubes; Frequency domain analysis; Optical coupling; Resonance; Time domain analysis; US Department of Transportation;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.7422
Filename
7422
Link To Document