• DocumentCode
    1468184
  • Title

    Determining mode excitations of vacuum electronics devices via three-dimensional simulations using the SOS code

  • Author

    Warren, Gary

  • Author_Institution
    Mission Res. Corp., Newington, VA, USA
  • Volume
    35
  • Issue
    11
  • fYear
    1988
  • fDate
    11/1/1988 12:00:00 AM
  • Firstpage
    2027
  • Lastpage
    2033
  • Abstract
    Examined the feasibility of determining via simulation the mode excitation behavior of vacuum electronic devices. The SOS code was used to compute the resonance modes (frequency-domain information) of sample devices and separately to compute the transient behavior of the same devices. Then a new code, DOT, to compute appropriate dot products of the time-domain and frequency-domain results and the transient behavior of individual modes in the device. Modes in a coupled-cavity traveling-wave tube (CCTWT) section excited with coaxial E-probes (cable stubs) and with an electron beam were analyzed in separate simulations. The authors examined whether the transient waves were forward or backward waves for each case. Finally, they computed the hot-test mode frequencies of the CCTWT section
  • Keywords
    electron beams; travelling-wave-tubes; vacuum tubes; SOS code; backward waves; coaxial E-probes; coupled-cavity traveling-wave tube; dot products; frequency-domain; frequency-domain information; hot-test mode frequencies; mode excitations; resonance modes; sample devices; three-dimensional simulations; time-domain; transient behavior; vacuum electronics devices; Analytical models; Coaxial cables; Computational modeling; Electron beams; Electron tubes; Frequency domain analysis; Optical coupling; Resonance; Time domain analysis; US Department of Transportation;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.7422
  • Filename
    7422