DocumentCode
1468543
Title
Extraction of noise parameters of transistor using a spectrum analyser and 50 Θ noise figure measurements only
Author
Lázaro, A. ; Pradell, L.
Author_Institution
Polytech. Univ. of Catalunya, Barcelona, Spain
Volume
34
Issue
24
fYear
1998
fDate
11/26/1998 12:00:00 AM
Firstpage
2353
Lastpage
2354
Abstract
A method for measuring the four noise parameters of a transistor in the microwave range using a configuration based on a conventional spectrum analyser is presented. In contrast to previous methods, it requires wideband 50 Θ noise-figure measurements only. The method features an accuracy similar to that of noise figure meters at a much higher measurement speed and lower cost
Keywords
electric noise measurement; microwave measurement; microwave transistors; semiconductor device measurement; spectral analysers; 50 ohm; measurement speed; microwave range; microwave transistors; noise figure measurements; noise parameters; spectrum analyser;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19981592
Filename
743045
Link To Document