DocumentCode :
1468560
Title :
Chip Error Pattern Analysis in IEEE 802.15.4
Author :
Wu, Kaishun ; Tan, Haoyu ; Ngan, Hoi-Lun ; Liu, Yunhuai ; Ni, Lionel M.
Author_Institution :
Phys. & Eng, Sun Yat-sen Univ., Guangzhou, China
Volume :
11
Issue :
4
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
543
Lastpage :
552
Abstract :
IEEE 802.15.4 standard specifies physical layer (PHY) and medium access control (MAC) sublayer protocols for low-rate and low-power communication applications. In this protocol, every 4-bit symbol is encoded into a sequence of 32 chips that are actually transmitted over the air. The 32 chips as a whole is also called a pseudonoise code (PN-Code). Due to complex channel conditions such as attenuation and interference, the transmitted PN-Code will often be received with some PN-Code chips corrupted. In this paper, we conduct a systematic analysis on these errors occurring at chip level. We find that there are notable error patterns corresponding to different cases. We then show that recognizing these patterns enables us to identify the channel condition in great details. We believe that understanding what happened to the transmission in our way can potentially bring benefit to channel coding, routing, and error correction protocol design. Finally, we propose Simple Rule, a simple yet effective method based on the chip error patterns to infer the link condition with an accuracy of over 96 percent in our evaluations.
Keywords :
Zigbee; access protocols; channel coding; error analysis; pseudonoise codes; telecommunication network routing; IEEE 802.15.4 standard specifies physical layer; MAC sublayer protocols; PN-code chips; channel coding; chip error pattern analysis; complex channel conditions; error correction protocol design; low-power communication applications; low-rate communication applications; medium access control protocols; pseudonoise code; Attenuation; Bars; Interference; Measurement; Mobile computing; Spread spectrum communication; Time series analysis; IEEE 802.15.4; chip error patterns; measurement study.; physical layer (PHY); pseudonoise (PN) codes;
fLanguage :
English
Journal_Title :
Mobile Computing, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-1233
Type :
jour
DOI :
10.1109/TMC.2011.44
Filename :
5728819
Link To Document :
بازگشت