• DocumentCode
    1468607
  • Title

    Improving design dependability by exploiting an open model-based specification

  • Author

    Tomita, Aki Watanabe ; Sakamura, Ken

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    48
  • Issue
    1
  • fYear
    1999
  • fDate
    1/1/1999 12:00:00 AM
  • Firstpage
    24
  • Lastpage
    37
  • Abstract
    In an open system standards environment, a formal specification can be shared by all of its implementations, which results in the sharing of development cost. This paper presents a specification-based adaptive test case generation (SBATCG) method for generating validation test cases and a specification-based adaptive consistency check generation (SBACCG) method for generating on-line consistency checks for implementations developed from a model-based specification. The SBATCG (SBACCG) method first derives test cases (consistency checks) through rigorous exploration of a model-based specification, adapts the test cases (consistency checks) to the program structure of a particular implementation, and then produces test cases (consistency checks) that are particularly suitable for the implementation. Testing does not guarantee a program´s freedom from faults. The results of the fault-injection experiment show that the SBACCG method can complement the SBATCG method
  • Keywords
    formal specification; program testing; software fault tolerance; adaptive consistency check generation; adaptive test case generation; consistency checks; design dependability; fault-injection experiment; formal specification; model-based specification; open model-based specification; open system standards environment; program structure; validation test cases; Computer networks; Costs; Fault tolerance; Formal specifications; Open systems; Operating systems; Software testing; Standardization; Standards development; System testing;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.743409
  • Filename
    743409