DocumentCode
1468713
Title
Design and Fabrication of a Silicon Interposer With TSVs in Cavities for Three-Dimensional IC Packaging
Author
Zhang, Rong ; Lo, Jeffery C C ; Lee, S. W Ricky
Author_Institution
Electron. Packaging Lab., Hong Kong Univ. of Sci. & Technol., Kowloon, China
Volume
12
Issue
2
fYear
2012
fDate
6/1/2012 12:00:00 AM
Firstpage
189
Lastpage
193
Abstract
Flip chip is one of the packaging techniques for high-performance components. There is a greater demand on integrating more functions in a smaller chip nowadays. This leads to the increase of I/O density. Organic substrate is the bottleneck of the high-density packaging. A silicon interposer with through-silicon vias (TSVs) is commonly used to provide a platform with a high wiring density to redistribute I/Os. After I/O redistribution, larger solder joints with a larger pitch can be used to connect the interposer to the organic substrate. In this paper, a TSV-based silicon interposer with a cavity and copper pillars for 3-D packaging is presented. The cavity hosts the flip-chip device. There are copper-filled TSVs in the cavity to provide the electrical interconnections to the backside of the interposer. Flip-chip solder bumps are electroplated on the copper pillars. Subsequent to the flip-chip assembly process, the device is seated in the cavity entirely. The backside of the flip chip is lower than that of the surface of the interposer. This provides a better environment for further die stacking on the surface of the interposer. The microfabrication process of the proposed silicon interposer with TSVs in cavities is discussed in detail.
Keywords
integrated circuit interconnections; integrated circuit packaging; silicon; solders; three-dimensional integrated circuits; I/O density; I/O redistribution; TSV-based silicon interposer; cavities; copper pillars; electrical interconnections; flip-chip assembly process; flip-chip solder bump; high wiring density; high-density packaging; high-performance components; organic substrate; silicon interposer fabrication; solder joints; three-dimensional IC packaging technique; through-silicon via; Cavity resonators; Copper; Etching; Flip chip; Packaging; Silicon; Three dimensional displays; 3-D packaging; Cavities; interposer; through-silicon via (TSV);
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2012.2190764
Filename
6168823
Link To Document