DocumentCode :
1468749
Title :
Role of velocity saturation in lifting pinchoff condition in long-channel MOSFET
Author :
Arora, Vijay K. ; Das, M.B.
Author_Institution :
Dept. of Electr. Eng., Wilkes Coll., Wilkes-Barre, PA, USA
Volume :
25
Issue :
13
fYear :
1989
fDate :
6/22/1989 12:00:00 AM
Firstpage :
820
Lastpage :
821
Abstract :
The role of velocity saturation due to high-field mobility degradation in lifting the pinchoff condition in a long-channel MOSFET is described. The electric field on the drain end at the onset of current saturation is always extremely high leading to the velocity saturation of the carriers. This velocity saturation leads to the saturation value nsD=nsoVg´/2Vc=IDsat/q nu th W on the drain end, in contrast with the well-known pinchoff behaviour, where the carrier density is shown to vanish at the saturation point. The carrier distribution, as well as the velocity distribution as a function of the channel distance along the length of the channel, is presented.
Keywords :
insulated gate field effect transistors; semiconductor device models; carrier distribution; channel distance; current saturation; distance along channel; electric field; high-field mobility degradation; long-channel MOSFET; models; pinchoff condition; role of velocity saturation; velocity distribution;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19890552
Filename :
91779
Link To Document :
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