Title :
An analysis of dynamic element matching flash digital-to-analog converters
Author :
Stubberud, Peter ; Bruce, J.W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Nevada Univ., Las Vegas, NV, USA
fDate :
2/1/2001 12:00:00 AM
Abstract :
Although many dynamic element matching (DEM) digital-to-analog converters (DACs) have identical architectures, analyses of DEM DACs have been specific to the DAC DEM algorithm or based on simulation results. In this paper, a commonly used flash DEM DAC architecture is analyzed. Using this analysis, a DEM DAC´s mean integral nonlinearity (INL), variance of the LNL, output signal-to-distortion ratio, output signal-to-(noise plus distortion) ratio, and spurious-free dynamic range can be calculated theoretically. These theoretical measures can be used as criteria for comparing the performance of different DEM algorithms applied to the particular flash DEM DAC architecture analyzed in this paper. As an example, two new DEM algorithms-a barrel shift network controlled by a white stochastic signal and a generalized cube interconnection network (GCN) controlled by a colored stochastic signal-are introduced and compared with two stochastic DEM algorithms: a Benes network and a GCN-both of which are controlled by a white stochastic signal-and one deterministic DEM algorithm called clock-level averaging. In the example, the performance criteria are calculated theoretically and by simulation
Keywords :
digital-analogue conversion; electric distortion; stochastic processes; Benes network; DAC architecture; INL variance; barrel shift network; clock-level averaging; colored stochastic signal; deterministic DEM algorithm; digital-to-analog converters; dynamic element matching; flash DAC; generalized cube interconnection network; mean integral nonlinearity; performance criteria; signal-to-distortion ratio; spurious-free dynamic range; white stochastic signal; Algorithm design and analysis; Analysis of variance; Analytical models; Digital-analog conversion; Distortion measurement; Dynamic range; Particle measurements; Performance analysis; Signal analysis; Stochastic processes;
Journal_Title :
Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on