Title :
A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits
Author :
Pleskacz, Witold A. ; Ouyang, Charles H. ; Maly, Wojciech
Author_Institution :
Inst. of Microelectron. & Optoelectron., Warsaw Univ. of Technol., Poland
fDate :
2/1/1999 12:00:00 AM
Abstract :
This paper describes an algorithm for the extraction of the critical area for opens. The presented algorithm allows for the analysis of industrial size ICs with non-Manhattan geometry. Illustrative examples of the proposed algorithm, implemented by using design rule checker operations, are presented. It is shown that the extraction of the critical area for realistic size VLSI circuits designs can be done in an acceptable time
Keywords :
VLSI; fault simulation; integrated circuit design; integrated circuit modelling; DRC algorithm; VLSI IC; critical area; design rule checker; nonManhattan geometry; open fault; parameter extraction; Algorithm design and analysis; Circuit faults; Circuit synthesis; Conducting materials; Contacts; Geometry; Insulation; Integrated circuit interconnections; Very large scale integration; Yield estimation;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
