DocumentCode :
1468944
Title :
Uniform wafer-bonded oxide-confined bottom-emitting 850-nm VCSEL arrays on sapphire substrates
Author :
Chao-Kun Lin ; Dapkus, P.D.
Author_Institution :
Center for Photonic Technol., Univ. of Southern California, Los Angeles, CA, USA
Volume :
13
Issue :
4
fYear :
2001
fDate :
4/1/2001 12:00:00 AM
Firstpage :
263
Lastpage :
265
Abstract :
Uniform bottom-emitting 850-nm vertical-cavity surface-emitting laser (VCSEL) arrays on sapphire substrates have been demonstrated using wafer bonding technology to transfer the epitaxially-grown VCSEL structures from GaAs substrates onto sapphire substrates. The uniformity of the VCSEL arrays were improved by placing thin oxide aperture at the standing wave node to reduce scattering loss for small aperture devices. The averaged threshold current of a 5×5 VCSEL array is as low as 346 μA, while the averaged external quantum efficiency approaches 57%. The maximum wall-plug efficiency is 25% and the single-mode output power is more than 2 mW under continuous-wave current excitation at room temperature. We have also demonstrated a large (10×20) VCSEL array with variations of threshold current and external quantum efficiency less than 4% and 2%, respectively.
Keywords :
infrared sources; laser transitions; optical fabrication; semiconductor laser arrays; substrates; wafer bonding; 2 mW; 2 percent; 25 percent; 346 muA; 4 percent; 5/spl times/5 VCSEL array; 57 percent; 850 nm; GaAs substrates; VCSEL; averaged external quantum efficiency; averaged threshold current; continuous-wave current excitation; epitaxially-grown VCSEL structures; external quantum efficiency; maximum wall-plug efficiency; room temperature; sapphire substrates; scattering loss; single-mode output power; small aperture devices; standing wave node; thin oxide aperture; threshold current; uniform wafer-bonded oxide-confined bottom-emitting 850-nm VCSEL arrays; wafer bonding technology; Apertures; Gallium arsenide; Optical arrays; Particle scattering; Power generation; Substrates; Surface emitting lasers; Threshold current; Vertical cavity surface emitting lasers; Wafer bonding;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.917819
Filename :
917819
Link To Document :
بازگشت