Abstract :
A new and effective pseudorandom test pattern generator, termed GLFSR, is introduced. These are linear feedback shift registers (LFSR´s) over a Galois field GF(2δ), (δ>1). Unlike conventional LFSR´s, which are over GF(2), these generators are not equivalent to cellular arrays and are shown to achieve significantly higher fault coverage. Experimental results are presented in this paper depicting that the proposed GLFSR can attain fault coverage equivalent to the LPSR, but with significantly fewer patterns. Specifically, results obtained demonstrate that in combinational circuits, for both stuck-at as well as transition faults, the proposed GLFSR outperforms all conventional pattern generators. Moreover, these experimental results are validated by certain randomness tests which demonstrate that the patterns generated by GLFSR achieve a higher degree of randomless
Keywords :
Galois fields; automatic test pattern generation; built-in self test; combinational circuits; delays; integrated circuit testing; integrated logic circuits; logic testing; shift registers; BIST; GLFSR; Galois field; LFSR; built-in-self-test; combinational circuits; fault coverage; linear feedback shift registers; pseudorandom TPG; pseudorandom test pattern generator; stuck-at faults; transition faults; Built-in self-test; Circuit faults; Circuit testing; DH-HEMTs; Electrical fault detection; Fault detection; Galois fields; Linear feedback shift registers; Shift registers; Test pattern generators;
