DocumentCode :
1469634
Title :
Comparison of Measurements of Charge Transfer Inefficiencies in a CCD With High-Speed Column Parallel Readout
Author :
Sopczak, André ; Aoulmit, Salim ; Bekhouche, Khaled ; Bowdery, Chris ; Buttar, Craig ; Damerell, Chris ; Djendaoui, Dahmane ; Dehimi, Lakhdar ; Gao, Rui ; Greenshaw, Tim ; Koziel, Michal ; Maneuski, Dzmitry ; Nomerotski, Andrei ; Sengouga, Nouredine ; Ste
Author_Institution :
Lancaster Univ., Lancaster, UK
Volume :
57
Issue :
2
fYear :
2010
fDate :
4/1/2010 12:00:00 AM
Firstpage :
854
Lastpage :
859
Abstract :
Charge Coupled Devices (CCDs) have been successfully used in several high energy physics experiments over the past two decades. Their high spatial resolution and thin sensitive layers make them an excellent tool for studying short-lived particles. The Linear Collider Flavour Identification (LCFI) Collaboration has been developing Column-Parallel CCDs for the vertex detector of a future Linear Collider which can be read out many times faster than standard CCDs. The most recent studies are of devices designed to reduce both the CCD´s intergate capacitance and the clock voltages necessary to drive it. A comparative study of measured Charge Transfer Inefficiency values between our previous and new results for a range of operating temperatures is presented.
Keywords :
charge-coupled devices; nuclear electronics; readout electronics; CCD intergate capacitance; Linear Collider Flavour Identification Collaboration; charge coupled devices; charge transfer inefficiencies; clock voltages; column-parallel CCDs; high energy physics experiments; high spatial resolution; high-speed column parallel readout; sensitive layers; vertex detector; Capacitance; Charge coupled devices; Charge measurement; Charge transfer; Charge-coupled image sensors; Collaboration; Current measurement; Detectors; Spatial resolution; Standards development; CCD; CPCCD; LCFI; charge transfer inefficiency; radiation damage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2010.2041672
Filename :
5446481
Link To Document :
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