Title :
Reducing Measurement Uncertainties Using Bias Cycled Measurement in MOS Dosimetry at Different Temperatures
Author :
Lipovetzky, José ; Redin, Eduardo Gabriel ; Inza, Mariano Andrés García ; Carbonetto, Sebastián ; Faigón, Adrián
Author_Institution :
Dept. de Fis., Univ. de Buenos Aires, Buenos Aires, Argentina
fDate :
4/1/2010 12:00:00 AM
Abstract :
Temperature dependence of MOS dosimeters response used under the Bias Controlled Cycled Measurement technique is investigated. The use of the biasing technique allows the compensation of temperature-induced changes in the response of the sensors, and reduces at least ten times the dose measurement error caused by undesired threshold voltage shifts.
Keywords :
dosimetry; radiation effects; semiconductor counters; MOS Dosimetry; bias controlled cycled measurement technique; dose measurement error; metal oxide semiconductor dosimetry; temperature-induced changes; Dosimetry; Electron traps; Laboratories; MOSFETs; Measurement uncertainty; Physics; Radiation effects; Temperature sensors; Threshold voltage; Voltage control; Dosimetry; MOS devices; radiation effects; temperature;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2042178
