Title :
A Fully Fledged TDC Implemented in Field-Programmable Gate Arrays
Author :
Wang, Jinhong ; Liu, Shubin ; Shen, Qi ; Li, Hao ; An, Qi
Author_Institution :
Dept. of Modern Phys., Univ. of Sci. & Technol. of China, Hefei, China
fDate :
4/1/2010 12:00:00 AM
Abstract :
The motivation of this paper is to implement a fully fledged time-to-digital converter (TDC) in a field-programmable gate array from Xilinx Virtex 4 family with self-test and temperature variation compensation features. The TDC resolution is temperature and supply voltage dependent which, to a large part, is compensated. A self-test procedure, which covers a temperature range of 30 °C to 60 °C is used to determine the compensation constants. After compensation and integral nonlinearity (INL) calibration, the TDC presents a timing resolution of 25 ps RMS or 50 ps per LSB. A total of 9 channels TDCs are implemented in a single FPGA.
Keywords :
convertors; field programmable gate arrays; Xilinx Virtex 4 family; compensation constants; field-programmable gate arrays; fully fledged TDC implemented; integral nonlinearity calibration; self-test; supply voltage dependent; temperature 30 degC to 60 degC; temperature variation compensation; time-to-digital converter; Built-in self-test; Clocks; Counting circuits; Delay effects; Delay lines; Field programmable gate arrays; Interpolation; Temperature; Time measurement; Timing; Compensation; field-programmable gate arrays (FPGAs); time measurement; time-to-digital converter;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2037958
