Title :
Characterizing Jitter Performance of Multi Gigabit FPGA-Embedded Serial Transceivers
Author :
Aloisio, Alberto ; Cevenini, Francesco ; Giordano, Raffaele ; Izzo, Vincenzo
Author_Institution :
Dipt. di Sci. Fis., Univ. degli Studi di Napoli Federico II, Naples, Italy
fDate :
4/1/2010 12:00:00 AM
Abstract :
High-speed serial links are a key component of data acquisition systems for High Energy Physics. They carry physics events data and often also clock, trigger and fast control signals. For the latter applications, the jitter on the clock recovered from the serial stream is a critical parameter since it directly affects the timing performance of data acquisition and trigger systems. Latest Field Programmable Gate Arrays (FPGAs) include multi-gigabit serial transceivers, which are configurable with various options and support many data encodings. However, an in-depth jitter characterization of those devices is not available yet. In this paper we present measurements of the jitter on the clock recovered by a GTP transceiver (embedded in a Xilinx Virtex 5 FPGA) as a function of the data pattern, coding and logic activity on the transmitter and receiver FPGAs.
Keywords :
data acquisition; field programmable gate arrays; high energy physics instrumentation computing; nuclear electronics; synchronisation; timing jitter; transceivers; trigger circuits; Xilinx Virtex 5 FPGA; clock recovery; coding; data acquisition system timing performance; data pattern; field programmable gate arrays; high energy physics data acquisition systems; high speed serial links; jitter performance characterisation; logic activity; multiGigabit FPGA embedded serial transceivers; multiGigabit serial transceivers; receiver FPGA; transmitter FPGA; trigger system timing performance; Clocks; Control systems; Data acquisition; Field programmable gate arrays; Large Hadron Collider; Optical transmitters; Performance evaluation; Programmable logic arrays; Timing jitter; Transceivers; FPGAs; jitter; recovered clock; serial links;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2032291