DocumentCode
1470000
Title
Effect of GaSb growth temperature on p-GaSb/n-GaAs diodes grown by MOVPE
Author
Haywood, S.K. ; Scott, C.G. ; Sweile, G.M. ; Lakrimi, M. ; Mason, N.J. ; Walker, P.J. ; Zheng, L.
Author_Institution
Sch. of Eng., Hull Univ., UK
Volume
145
Issue
5
fYear
1998
fDate
10/1/1998 12:00:00 AM
Firstpage
287
Lastpage
291
Abstract
Despite the 7% lattice mismatch, the reverse bias dark current of p-GaSb/n-GaAs junctions has been found to be unexpectedly low. MOVPE-grown diodes exhibited dark currents up to two orders of magnitude lower than comparable GaSb homojunctions. The initial nucleation of GaSb on GaAs was found to play an important role in determining the properties of the bulk layer. A larger number of small nucleation sites produced diodes with lower reverse bias leakage currents and growth temperature was in turn critical in determining the size of these nucleation islands. The authors present a study correlating growth temperature with nucleation site density, dark current and open circuit voltage under illumination. Diodes were grown at temperatures ranging from 490-550°C using TMGa and TMSb. A reduction in reverse bias dark current of several orders of magnitude was observed across this narrow temperature range. The `turn-on´ voltage also increased with reduction in growth temperature and there was a corresponding increase in the average open voltage, Voc, under illumination. However, Voc did exceed ~0.25 V. This is low compared to GaSb homojunctions (typically 0.45 V) and it may be limited by a low shunt resistance under illumination as well as low efficiency from the thin GaSb layers. Other alkyls [TIPGa and t-DMASb], which allow a further reduction in growth temperature, are being investigated
Keywords
III-V semiconductors; dark conductivity; gallium arsenide; gallium compounds; leakage currents; nucleation; optical fabrication; semiconductor growth; semiconductor lasers; vapour phase epitaxial growth; 490 to 550 C; GaAs; GaSb; GaSb growth temperature; GaSb homojunctions; MOVPE growth; MOVPE-grown diodes; average open voltage; bulk layer; dark currents; growth temperature; initial nucleation; laser diode fabrication; lattice mismatch; low shunt resistance; nucleation island; p-GaSb/n-GaAs diodes; p-GaSb/n-GaAs junctions; reverse bias dark current; reverse bias leakage currents; thin GaSb layers; turn-on voltage;
fLanguage
English
Journal_Title
Optoelectronics, IEE Proceedings -
Publisher
iet
ISSN
1350-2433
Type
jour
DOI
10.1049/ip-opt:19982312
Filename
744062
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