DocumentCode :
1470166
Title :
ATPRG: an automatic test program generator using HDL-A for fault diagnosis of analog/mixed-signal integrated circuits
Author :
Huang, Wei-Hsing ; Wey, Chin-Long
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Volume :
47
Issue :
2
fYear :
1998
fDate :
4/1/1998 12:00:00 AM
Firstpage :
426
Lastpage :
431
Abstract :
HDL-A is an analog version of the Hardware Description Language which is suitable for structural and behavioral descriptions and simulations of digital, analog, and mixed-signal circuits and systems. This paper presents an automatic test program generator (ATPRG) for fault diagnosis of analog/mixed-signal integrated circuits. The ATPRG is developed under the Mentor Graphics Design system environment, where the units under test (UUT´s) are modeled in HDL-A and simulated by Accusim, and AMPLE (Advanced Multi-Purpose Language) in Mentor Graphics Design system environment is used to define and execute the generation process automatically. To increase the reliability and quality, the generated test programs will be verified and validated. A verification process checks if the test programs are generated correctly and if the generated test programs can effectively locate fault(s). The test programs are validated by emulating the UUT´s. The actual test can be run in a fully automatic mode, or interactively
Keywords :
analogue integrated circuits; automatic test pattern generation; fault diagnosis; hardware description languages; integrated circuit testing; mixed analogue-digital integrated circuits; AMPLE; ATPRG; Accusim; HDL-A; Mentor Graphics Design system environment; UUT; advanced multi-purpose language; analog integrated circuits; automatic test program generator; behavioral descriptions; fault diagnosis; fully automatic mode; mixed-signal integrated circuits; structural descriptions; verification process; Automatic programming; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Circuits and systems; Fault diagnosis; Graphics; Hardware design languages; Integrated circuit testing;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.744186
Filename :
744186
Link To Document :
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