• DocumentCode
    1470279
  • Title

    Stable and efficient reduction of large, multiport RC networks by pole analysis via congruence transformations

  • Author

    Kerns, Kevin J. ; Yang, Andrew T.

  • Author_Institution
    Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
  • Volume
    16
  • Issue
    7
  • fYear
    1997
  • fDate
    7/1/1997 12:00:00 AM
  • Firstpage
    734
  • Lastpage
    744
  • Abstract
    A novel technique is presented which employs pole analysis via congruence transformations (PACT) to reduce RC networks in a well-conditioned manner. Pole analysis is shown to be more efficient than Pade approximations when the number of network ports is large, and congruence transformations preserve the passivity (and thus absolute stability) of the networks. The error incurred by reducing the networks is shown to be bounded by values which are fully selectable by the user. Networks are represented by admittance matrices throughout the analysis, and this representation both simplifies interfacing the reduced networks with circuit simulators and facilitates realization of the reduced networks using RC elements. A prototype SPICE-in, SPICE-out, network reduction CAD tool called RCFIT is detailed, and examples are presented which demonstrate the accuracy and efficiency of the PACT algorithm
  • Keywords
    RC circuits; SPICE; absolute stability; circuit CAD; circuit analysis computing; circuit stability; electric admittance; multiport networks; passive networks; pole assignment; PACT algorithm; RCFIT; SPICE; absolute stability; admittance matrix; circuit simulator; large multiport RC network; network reduction CAD tool; passivity; pole analysis via congruence transformations; Admittance; Analytical models; Circuit simulation; Circuit stability; Design automation; Parasitic capacitance; Passive networks; Prototypes; Stability analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.644034
  • Filename
    644034