DocumentCode :
147041
Title :
Selective compression technique using Variable-to-Fixed coding
Author :
Jacob, Karen Thangam ; Ganesh Kumar, K.S. ; Manjurathi, B.
Author_Institution :
Karunya Univ., Coimbatore, India
fYear :
2014
fDate :
3-5 April 2014
Firstpage :
1016
Lastpage :
1020
Abstract :
Inthis paper, we propose a code based technique, Variable-to-Fixed (V-F) coding, for power efficient test data compression. The proposed scheme with the aim of achieving high compression ratio and low power consumption relies on reducing, the number of bits for representing the original test vector and the number of transitions per second. Simulation results on ISCAS´89 benchmark circuits, demonstrate that this optimization methodology helps achieve reduced test data volume than previous schemes for cases where the number of specified bits in the test set is relatively few.
Keywords :
data compression; logic testing; system-on-chip; ISCAS´89 benchmark circuits; code based technique; high compression ratio; power consumption; power efficient test data compression; selective compression technique; test data volume; test vector; variable-to-fixed coding; Compaction; Switches; Compression ratio; Critical Value; Test data compression; Variable-to-Fixed codes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications and Signal Processing (ICCSP), 2014 International Conference on
Conference_Location :
Melmaruvathur
Print_ISBN :
978-1-4799-3357-0
Type :
conf
DOI :
10.1109/ICCSP.2014.6950000
Filename :
6950000
Link To Document :
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