Interlaboratory comparison of Josephson voltage standards

Author

Deaver, David ; Miller, William B. ; Pardo, Leonard ; Jaeger, Klaus ; Plowman, Dennis ; Hamilton, Clark A.

Author_Institution

Fluke Corp., Everett, WA, USA

Volume

50

Issue

2

fYear

2001

fDate

4/1/2001 12:00:00 AM

Firstpage

199

Lastpage

202

Abstract

An interlaboratory comparison of Josephson Voltage Standards (JVS) has been made among 16 national, industrial; and military standards laboratories in North America and one in Europe. The comparison was made at 10 V using a set of four traveling Zener reference standards. A pivot laboratory made measurements at the beginning, at the end, and at nine other times during the comparison. The measured differences and their uncertainties are reported and used to establish a table of equivalence between each participant and the pivot, and between each participant and the National Institute of Standards and Technology (NIST). All but two of the differences fall within two parts in 10⁸

Keywords

Josephson effect; Zener diodes; laboratories; measurement standards; military standards; transfer standards; voltage measurement; 10 V; Europe; Josephson voltage standards; NIST; National Institute of Standards and Technology; North America; industrial standards laboratories; interlaboratory comparison; measurement uncertainties; military standards laboratories; national standards laboratories; traveling Zener reference standard; Battery charge measurement; Electrical resistance measurement; Extraterrestrial measurements; Laboratories; Measurement standards; Military standards; NIST; Particle measurements; Switches; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.918101

Filename

918101