• DocumentCode
    1470595
  • Title

    The Study of Self-Heating and Hot-Electron Effects for AlGaN/GaN Double-Channel HEMTs

  • Author

    Wang, Xiao-Dong ; Hu, Wei-Da ; Chen, Xiao-Shuang ; Lu, Wei

  • Author_Institution
    Nat. Lab. for Infrared Phys., Shanghai Inst. of Tech. Phys., Shanghai, China
  • Volume
    59
  • Issue
    5
  • fYear
    2012
  • fDate
    5/1/2012 12:00:00 AM
  • Firstpage
    1393
  • Lastpage
    1401
  • Abstract
    The direct current characteristics of AlGaN/GaN double-channel HEMTs (DC-HEMTs) are investigated by using 2-D numerical simulations. The output characteristics have been predicted with the drift-diffusion, thermodynamic, hydrodynamic, and hot-electron models, respectively. The prediction by the hydrodynamic model is in good agreement with the experiment. It is demonstrated that the hot-electron effect makes a negligible contribution to the negative differential conductance (NDC) of an AlGaN/GaN DC-HEMT; instead, the NDC effect is caused by the self-heating effect. The transfer and transconductance characteristics of an AlGaN/GaN DC-HEMT are also discussed in detail. Finally, a new In0.18Al0.82N /GaN/AlGaN/GaN DC-HEMT structure is proposed for optimizing AlGaN/GaN DC-HEMTs.
  • Keywords
    III-V semiconductors; aluminium compounds; diffusion; gallium compounds; high electron mobility transistors; hot carriers; hydrodynamics; numerical analysis; semiconductor device models; thermodynamics; wide band gap semiconductors; 2D numerical simulations; AlGaN-GaN; DC-HEMT; NDC effect; direct current characteristics; double-channel HEMT; drift-diffusion model; hot-electron effects; hot-electron models; hydrodynamic model; negative differential conductance; self-heating effect; thermodynamic model; transconductance characteristics; Aluminum gallium nitride; Gallium nitride; HEMTs; Lattices; MODFETs; Mathematical model; Thermodynamics; Double-channel HEMTs (DC-HEMTs); III–V semiconductors; hot-electron effect; self-heating effect;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2188634
  • Filename
    6170551