Title :
Interlaboratory comparison of Josephson voltage standards between NIST and Lockheed Martin Astronautics
Author :
Tang, Yi-hua ; Miller, William B.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
4/1/2001 12:00:00 AM
Abstract :
Two Josephson voltage standard (JVS) systems operated at the National Institute of Standards and Technology (NIST) and Lockheed Martin Astronautics (LMA) were compared by using four traveling Zener standards. A Measurement Assurance Program (MAP) protocol was adopted for the comparison. The Zener data were first corrected based on their pressure coefficients to compensate for the pressure difference due to the lab elevations and local meteorological conditions. The Welch-Satterthwaite formula and effective degrees of freedom (DOF) were then used to calculate the expanded uncertainty. The mean difference between the measurements of the two laboratories was found to be 0.059 μV with an expanded uncertainty of ±0.189 μV at the 95% confidence level
Keywords :
Josephson effect; Zener diodes; aerospace test facilities; laboratories; measurement standards; measurement uncertainty; voltage measurement; JVS; Josephson voltage standards; Lockheed Martin Astronautics; Measurement Assurance Program protocol; NIST; National Institute of Standards and Technology; Welch-Satterthwaite formula; effective degrees of freedom; mean difference 0.059 μV; meteorological conditions; pressure difference; traveling Zener standards; uncertainty ±0.189 μV; Extraterrestrial measurements; Geologic measurements; Laboratories; Measurement standards; Meteorology; NIST; Pressure measurement; Protocols; Space technology; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
