Interlaboratory comparison of Josephson voltage standards between NIST and Lockheed Martin Astronautics

Author

Tang, Yi-hua ; Miller, William B.

Author_Institution

Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

Volume

50

Issue

2

fYear

2001

fDate

4/1/2001 12:00:00 AM

Firstpage

210

Lastpage

213

Abstract

Two Josephson voltage standard (JVS) systems operated at the National Institute of Standards and Technology (NIST) and Lockheed Martin Astronautics (LMA) were compared by using four traveling Zener standards. A Measurement Assurance Program (MAP) protocol was adopted for the comparison. The Zener data were first corrected based on their pressure coefficients to compensate for the pressure difference due to the lab elevations and local meteorological conditions. The Welch-Satterthwaite formula and effective degrees of freedom (DOF) were then used to calculate the expanded uncertainty. The mean difference between the measurements of the two laboratories was found to be 0.059 μV with an expanded uncertainty of ±0.189 μV at the 95% confidence level

Keywords

Josephson effect; Zener diodes; aerospace test facilities; laboratories; measurement standards; measurement uncertainty; voltage measurement; JVS; Josephson voltage standards; Lockheed Martin Astronautics; Measurement Assurance Program protocol; NIST; National Institute of Standards and Technology; Welch-Satterthwaite formula; effective degrees of freedom; mean difference 0.059 μV; meteorological conditions; pressure difference; traveling Zener standards; uncertainty ±0.189 μV; Extraterrestrial measurements; Geologic measurements; Laboratories; Measurement standards; Meteorology; NIST; Pressure measurement; Protocols; Space technology; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.918104

Filename

918104