Title :
Loss phenomena in the AC quantum Hall effect
Author :
Schurr, Jürgen ; Melcher, Jürgen ; Von Campenhausen, Aurel ; Pierz, Klaus ; Hein, Günter ; Ahlers, Franz-Josef
Author_Institution :
Phys. Tech. Bundesanstalt, Braunschweig, Germany
fDate :
4/1/2001 12:00:00 AM
Abstract :
We investigated the ac quantum Hall effect of several GaAs-based samples. The influence of temperature, current, and frequency was measured for the plateaux i=2. Some measurements of the plateaux i=4 were performed to determine the scaling behavior with respect to i. The observed relations can be described by simple formulas which provide some insight into the ac quantum Hall effect
Keywords :
III-V semiconductors; bridge circuits; characteristics measurement; coaxial cables; electric resistance measurement; gallium arsenide; loss measurement; quantum Hall effect; voltage measurement; GaAs; GaAs-based samples; ac quantum Hall effect; coaxial ac bridge; current; frequency; scaling behavior; temperature; Bridge circuits; Current measurement; Electrical resistance measurement; Frequency; Hall effect; Helium; Impedance; Magnetic field measurement; Resistors; Voltage measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
