Title :
Comparison of four QHR systems within one month using a temperature and pressure stabilized 100-Ω resistor
Author :
Satrapinski, Alexandre ; Seppä, Hekki ; Schumacher, Bernd ; Warnecke, Peter ; Delahaye, François ; Poirier, Wilfrid ; Piquemal, Françoise
Author_Institution :
Center for Metrol. & Accreditation, Espoo, Finland
fDate :
4/1/2001 12:00:00 AM
Abstract :
We have carried out a resistance comparison of four QHR systems using a 100-Ω resistor in a temperature-controlled and hermetically sealed enclosure, the comparison was performed in November and December 1998, the participants were Bureau International des Poids et Mesures (BIPM), Bureau National de Metrology-Laboratoire Central des Industries Electroniques (BNM-LCIE) France, Physikalisch-Technische Bundesanstalt (PTB) Germany, and Valtion Teknillinen Tutkimuskeskus (VTT Automation) Finland, acting as a pilot laboratory. The comparison results agree within 3 parts in 109 with a relative combined standard uncertainty of ±1×10-8
Keywords :
bridge circuits; electric resistance measurement; quantum Hall effect; resistors; transfer standards; 100 ohm; CCC resistance bridge; hermetically sealed enclosure; pressure stabilized resistor; quantum Hall resistance systems; relative combined standard uncertainty; temperature stabilized resistor; temperature-controlled enclosure; transfer standards comparison; Air transportation; Automation; Electrical resistance measurement; Hermetic seals; Laboratories; Measurement standards; Resistors; Temperature control; Temperature dependence; Thermal resistance;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
