DocumentCode :
1470719
Title :
Emission dynamics of dot and wire DFB lasers
Author :
Wang, Jian ; Griesinger, Uwe A. ; Geiger, Michael ; Ottenwaelder, Dietmar ; Scholz, Ferdinand ; Schweizer, Heinz
Author_Institution :
Phys. Inst., Stuttgart Univ., Germany
Volume :
8
Issue :
12
fYear :
1996
Firstpage :
1585
Lastpage :
1587
Abstract :
Emission dynamics of InGaAs-InGaAsP dot and wire DFB lasers were systematically investigated and compared with quantum-well lasers. Accordingly, the effective carrier capture times, which limit the maximum modulation bandwidth of low-dimensional semiconductor lasers, were determined and compared for these lasers. A quite large effective capture time of about 350 ps was found for the dot laser in contrast to about 56 ps for the quantum-well laser. This is attributed to a dramatically reduced volume of active region which induces a large scaled-up quantum capture time in the dot lasers. The systematic comparison of the quantum-well, -wire and -dot lasers reveal the dominant limitation of geometry effect on the high-speed modulation of quantum-wire and -dot lasers except when the packing density of the dots or wires is increased.
Keywords :
III-V semiconductors; electro-optical modulation; gallium arsenide; gallium compounds; geometry; high-speed optical techniques; indium compounds; quantum well lasers; semiconductor quantum dots; semiconductor quantum wires; 350 ps; 56 ps; InGaAs-InGaAsP; InGaAs-InGaAsP DFB lasers; active region volume; effective carrier capture times; emission dynamics; geometry effect; high-speed modulation; large effective capture time; large scaled-up quantum capture time; low-dimensional semiconductor lasers; maximum modulation bandwidth; packing density; quantum dot lasers; quantum wire DFB lasers; quantum-well lasers; Bandwidth; Carrier confinement; Chemical lasers; Laser theory; Quantum dot lasers; Quantum well lasers; Semiconductor lasers; US Department of Transportation; Waveguide lasers; Wire;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.544685
Filename :
544685
Link To Document :
بازگشت