DocumentCode
1470784
Title
Multi-Scale Monte Carlo Simulation of Soft Errors Using PHITS-HyENEXSS Code System
Author
Abe, Shin-Ichiro ; Watanabe, Yukinobu ; Shibano, Nozomi ; Sano, Nobuyuki ; Furuta, Hiroshi ; Tsutsui, Masafumi ; Uemura, Taiki ; Arakawa, Takahiko
Author_Institution
Department of Advanced Energy Engineering, Kyushu University, Fukuoka, Japan
Volume
59
Issue
4
fYear
2012
Firstpage
965
Lastpage
970
Abstract
We have proposed a multi-scale Monte Carlo simulation method of neutron induced soft errors by linking a particle transport code PHITS and a 3-D TCAD simulator HyENEXSS. An interface tool between PHITS and HyENEXSS is developed to generate the mesh structure optimized for an event where multiple secondary ions extending to arbitrary directions are generated simultaneously by neutron incidence on device. Using the interface tool, we have made it possible to perform the Monte Carlo calculation of soft error rates (SERs) based on event-by-event device simulation. The PHITS-HyENEXSS code system has been successfully applied to SER analyses for 65 nm, 45 nm, and 32 nm technology MOSFETs.
Keywords
Ions; MOSFET circuits; Monte Carlo methods; Neutrons; Predictive models; Silicon; HyENEXSS; Monte Carlo simulation; PHITS; neutron radiation effects; soft errors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2012.2187215
Filename
6170578
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