DocumentCode :
1470811
Title :
Improving SEU Fault Tolerance Capabilities of a Self-Converging Algorithm
Author :
Velazco, Raoul ; Mansour, Wassim ; Pancher, Fabrice ; Marques-Costa, Greicy ; Sohier, Devan ; Bui, Alain
Author_Institution :
TIMA, Grenoble, France
Volume :
59
Issue :
4
fYear :
2012
Firstpage :
818
Lastpage :
823
Abstract :
The single-event upset (SEU) fault tolerance of a benchmark self-converging algorithm is evaluated by fault injection campaigns performed using a devoted test platform. The number of observed errors significantly decreases depending on adopted implementation strategies.
Keywords :
Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Radiation detectors; Registers; Software; Fault injection; fault tolerance; self-stabilization; single-event upset (SEU); triple modular redundancy (TMR);
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2012.2188303
Filename :
6170581
Link To Document :
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