Title :
Improving SEU Fault Tolerance Capabilities of a Self-Converging Algorithm
Author :
Velazco, Raoul ; Mansour, Wassim ; Pancher, Fabrice ; Marques-Costa, Greicy ; Sohier, Devan ; Bui, Alain
Author_Institution :
TIMA, Grenoble, France
Abstract :
The single-event upset (SEU) fault tolerance of a benchmark self-converging algorithm is evaluated by fault injection campaigns performed using a devoted test platform. The number of observed errors significantly decreases depending on adopted implementation strategies.
Keywords :
Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Radiation detectors; Registers; Software; Fault injection; fault tolerance; self-stabilization; single-event upset (SEU); triple modular redundancy (TMR);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2012.2188303