Development of an AC-DC thermal converter at millivolt level operating at cryogenic temperature

Author

Monticone, Eugenio ; Pogliano, Umberto ; Lacquaniti, Vincenzo ; Serazio, Danilo

Author_Institution

Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy

Volume

50

Issue

2

fYear

2001

fDate

4/1/2001 12:00:00 AM

Firstpage

338

Lastpage

341

Abstract

A device for the measurement of AC-DC transfer difference at millivolt signal level is under development at the IEN. In the fabrication of this device, a chromium heater, niobium leads, and a niobium transition edge thermometer have been deposited by evaporation on a silicon nitride (SiN) membrane. The sensitivity, the temperature rise of the heater, the temperature control of the support, and other possible effects influencing the AC-DC transfer difference have been investigated. This analysis and first experimental tests show the possibility of high accuracy AC-DC transfer measurements at the level of 1 mV

Keywords

convertors; low-temperature techniques; superconducting junction devices; temperature control; thermometers; thin film devices; transfer standards; voltage measurement; 1 mV; AC-DC thermal converter; AC-DC transfer difference; chromium heater; cryogenic temperature; high-accuracy measurements; millivolt level; niobium leads; niobium transition edge thermometer; sensitivity; silicon nitride membrane; temperature rise; transfer standards; Analog-digital conversion; Biomembranes; Chromium; Fabrication; Heat transfer; Niobium; Silicon compounds; Temperature control; Temperature sensors; Testing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.918136

Filename

918136