Title :
Development of an AC-DC thermal converter at millivolt level operating at cryogenic temperature
Author :
Monticone, Eugenio ; Pogliano, Umberto ; Lacquaniti, Vincenzo ; Serazio, Danilo
Author_Institution :
Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
fDate :
4/1/2001 12:00:00 AM
Abstract :
A device for the measurement of AC-DC transfer difference at millivolt signal level is under development at the IEN. In the fabrication of this device, a chromium heater, niobium leads, and a niobium transition edge thermometer have been deposited by evaporation on a silicon nitride (SiN) membrane. The sensitivity, the temperature rise of the heater, the temperature control of the support, and other possible effects influencing the AC-DC transfer difference have been investigated. This analysis and first experimental tests show the possibility of high accuracy AC-DC transfer measurements at the level of 1 mV
Keywords :
convertors; low-temperature techniques; superconducting junction devices; temperature control; thermometers; thin film devices; transfer standards; voltage measurement; 1 mV; AC-DC thermal converter; AC-DC transfer difference; chromium heater; cryogenic temperature; high-accuracy measurements; millivolt level; niobium leads; niobium transition edge thermometer; sensitivity; silicon nitride membrane; temperature rise; transfer standards; Analog-digital conversion; Biomembranes; Chromium; Fabrication; Heat transfer; Niobium; Silicon compounds; Temperature control; Temperature sensors; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
