Open-structure resonant technique for measuring the dielectric properties of materials

A newly developed resonant measurement technique is extended to include rotationally symmetric materials in general. The technique involves a full wave analysis of the fixture containing the material under test. Therefore, the measurement technique is not restricted by the dimensions of the material or its electrical properties. This work describes the measurement technique and provides a characterization of the TE₀₁₁ resonant mode. Also, a method to account for conduction loss due to the surface resistance of the metal walls of the fixture is presented. Experimental results are compared to previously reported values and are in excellent agreement