• DocumentCode
    1470892
  • Title

    On the use of the matrix pencil method for deep level transient spectroscopy: MP-DLTS

  • Author

    Boussaïd, Farïd ; Olivié, François ; Benzohra, Mohammed ; Martinez, Augustin

  • Author_Institution
    Lab. d´´Anal. et d´´Archit. des Syst., CNRS, Toulouse, France
  • Volume
    47
  • Issue
    3
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    692
  • Lastpage
    697
  • Abstract
    A new approach to capacitance transient analysis, based on the matrix pencil (MP) method, is proposed for deep level transient spectroscopy (DLTS) (MP-DLTS). The MP method offers the least statistical variance of the estimates in the presence of noise. Simulation tests have shown this method to lead to a significant improvement in DLTS resolution even for low trap concentrations. Its noise sensitivity and resolution are quantified and compared with five different DLTS analysis techniques. The MP-DLTS method is found to outperform both DLTS spectrum and direct transient analysis techniques. An experimental investigation of the electrically active defects induced by a germanium preamorphization step prior to dopant implantation was undertaken using the MP-DLTS method. Two electron traps were detected in all samples and characterized
  • Keywords
    deep level transient spectroscopy; eigenvalues and eigenfunctions; electron traps; elemental semiconductors; germanium; matrix decomposition; matrix inversion; phosphorus; silicon; Si:P,Ge; capacitance transient analysis; deep level transient spectroscopy; eigenvalues; electrically active defects; electron traps; figure of merit; germanium preamorphization step; low trap concentrations; matrix pencil method; multiexponential transient; noise sensitivity; simulation tests; statistical variance; Capacitance; Electron traps; Energy capture; Energy states; Isothermal processes; Semiconductor device noise; Signal resolution; Spectroscopy; Temperature; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.744327
  • Filename
    744327