Title :
Stability measurements on noise sources
Author :
Randa, J. ; Dunleavy, Lawrence P. ; Terrell, Leon A.
Author_Institution :
Radio-Frequency Technol. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
4/1/2001 12:00:00 AM
Abstract :
We report results of stability and repeatability measurements performed on a selection of different noise sources for selected frequencies between 12 GHz and 26.5 GHz. Measurements cover intervals classified as intermediate term (about 1 week) and long term (about 1 year or more). Noise sources measured include a commercial diode source, a gas-discharge source constructed by NIST, a specially modified commercial diode source, and a variable-temperature FET-based source. All sources exhibit excellent stability, typically consistent with zero drift in noise temperature within the uncertainty of the tests
Keywords :
calibration; electric noise measurement; measurement standards; measurement uncertainty; microwave reflectometry; radiometry; thermal noise; 12 to 26.5 GHz; calibration; check standards; commercial diode source; gas-discharge source; intermediate term; long term; noise measurement; noise sources; noise temperature; radiometer stability; repeatability measurements; stability measurements; thermal noise; uncertainty; variable-temperature FET-based source; zero drift; Calibration; Diodes; Measurement standards; NIST; Noise measurement; Performance evaluation; Stability; Temperature measurement; Testing; Time measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
