DocumentCode
1471114
Title
Portable I2-stabilized Nd:YAG laser for international comparisons
Author
Hong, Feng-Lei ; Ishikawa, Jun ; Bi, Zhi-Yi ; Zhang, Jing ; Seta, Katuo ; Onae, Atsushi ; Yoda, Jun ; Matsumoto, Hirokazu
Author_Institution
Nat. Res. Lab. of Metrol., Ibaraki, Japan
Volume
50
Issue
2
fYear
2001
fDate
4/1/2001 12:00:00 AM
Firstpage
486
Lastpage
489
Abstract
We have established a compact and transportable I2-stabilized Nd:YAG laser for international comparisons of laser frequency. The root Allan variance of the portable laser has reached 3.9×10-14 when the integration time is longer than 200 s. The results of an international comparison between the National Research Laboratory of Metrology (NRLM), Tsukuba, Japan and the JILA (formerly the Joint Institute for Laboratory Astrophysics), Boulder, CO, USA show that the frequency difference of the portable laser NRLM-Y1 and the JILA laser JILA-W (fNRLM-Y1-fJILA-W) was -2.5 kHz, when the cold-finger temperatures of NRLM-Y1 and JILA-W were kept at -10°C and -15°C, respectively. The averaged frequency offset between two NRLM lasers (fNRLM-Y1-fNRLM-Y2) was -1.1 kHz. A frequency variation of about 1.2 kHz was found for the frequency offset between two NRLM lasers, after NRLM-Y1 was taken for a round trip to Sydney for a comparison organized by the National Measurement Laboratory, (NML), Australia
Keywords
frequency standards; iodine; laser frequency stability; measurement by laser beam; neodymium; portable instruments; solid lasers; yttrium compounds; -10 C; -10°C; -15 C; -15°C; 1.1 kHz; 2.5 kHz; Australia; I2; I2-stabilized Nd:YAG laser; JILA laser; NML; National Measurement Laboratory; National Research Laboratory of Metrology; Nd:YAG; Nd:YAl5O12; Tsukuba Japan; cold-finger temperatures; international comparison; laser NRLM-Y1; optical frequency standard; portable laser; root Allan variance; Bismuth; Frequency measurement; Laboratories; Laser mode locking; Laser stability; Masers; Metrology; Reproducibility of results; Ultrafast optics; Uncertainty;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.918172
Filename
918172
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