DocumentCode :
1471114
Title :
Portable I2-stabilized Nd:YAG laser for international comparisons
Author :
Hong, Feng-Lei ; Ishikawa, Jun ; Bi, Zhi-Yi ; Zhang, Jing ; Seta, Katuo ; Onae, Atsushi ; Yoda, Jun ; Matsumoto, Hirokazu
Author_Institution :
Nat. Res. Lab. of Metrol., Ibaraki, Japan
Volume :
50
Issue :
2
fYear :
2001
fDate :
4/1/2001 12:00:00 AM
Firstpage :
486
Lastpage :
489
Abstract :
We have established a compact and transportable I2-stabilized Nd:YAG laser for international comparisons of laser frequency. The root Allan variance of the portable laser has reached 3.9×10-14 when the integration time is longer than 200 s. The results of an international comparison between the National Research Laboratory of Metrology (NRLM), Tsukuba, Japan and the JILA (formerly the Joint Institute for Laboratory Astrophysics), Boulder, CO, USA show that the frequency difference of the portable laser NRLM-Y1 and the JILA laser JILA-W (fNRLM-Y1-fJILA-W) was -2.5 kHz, when the cold-finger temperatures of NRLM-Y1 and JILA-W were kept at -10°C and -15°C, respectively. The averaged frequency offset between two NRLM lasers (fNRLM-Y1-fNRLM-Y2) was -1.1 kHz. A frequency variation of about 1.2 kHz was found for the frequency offset between two NRLM lasers, after NRLM-Y1 was taken for a round trip to Sydney for a comparison organized by the National Measurement Laboratory, (NML), Australia
Keywords :
frequency standards; iodine; laser frequency stability; measurement by laser beam; neodymium; portable instruments; solid lasers; yttrium compounds; -10 C; -10°C; -15 C; -15°C; 1.1 kHz; 2.5 kHz; Australia; I2; I2-stabilized Nd:YAG laser; JILA laser; NML; National Measurement Laboratory; National Research Laboratory of Metrology; Nd:YAG; Nd:YAl5O12; Tsukuba Japan; cold-finger temperatures; international comparison; laser NRLM-Y1; optical frequency standard; portable laser; root Allan variance; Bismuth; Frequency measurement; Laboratories; Laser mode locking; Laser stability; Masers; Metrology; Reproducibility of results; Ultrafast optics; Uncertainty;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.918172
Filename :
918172
Link To Document :
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