• DocumentCode
    1471303
  • Title

    Precision determination of the density of a single crystal silicon sphere and evaluation of the Avogadro constant

  • Author

    Kenny, Michael J. ; Leistner, Achim J. ; Walsh, Christopher J. ; Fen, Kitty ; Giardini, Walter J. ; Wielunski, Leszek S. ; Netterfield, Roger P. ; Ward, Bradley R.

  • Author_Institution
    CSIRO, Lindfield, NSW, Australia
  • Volume
    50
  • Issue
    2
  • fYear
    2001
  • fDate
    4/1/2001 12:00:00 AM
  • Firstpage
    587
  • Lastpage
    592
  • Abstract
    Density measurements with relative uncertainty of 1×10-7 have been made on a highly polished 1-kg single crystal silicon sphere with out-of-roundness <40 nm. Roundness was profiled using a 2-D Talyrond machine and 3-D profiles were produced. The diameter was obtained using optical interferometry for a series of breadth measurements at carefully selected points and by combining them with roundness data. The mass was obtained relative to a 1-kg stainless steel reference with appropriate corrections for air buoyancy and for convection currents due to small temperature differentials. Surface oxide thickness was measured using optical ellipsometry and the data were corrected for this oxide thickness. The molar mass, crystal quality and lattice parameter have been measured elsewhere, enabling a determination of the Avogadro constant to be made. The purpose is to obtain a definition of the kilogram in terms of a specific number of 12C atoms
  • Keywords
    constants; density measurement; ellipsometry; light interferometry; mass measurement; measurement standards; measurement uncertainty; units (measurement); 1 kg; 2D Talyrond machine; 3D profiles; Avogadro constant; Si; air buoyancy; breadth measurements; convection currents; crystal quality; density measurements; kilogram definition; lattice parameter; molar mass; optical ellipsometry; optical interferometry; out-of-roundness; oxide thickness; relative uncertainty; roundness data; single crystal sphere; stainless steel reference; temperature differentials; Atomic measurements; Fabrication; Laboratories; Lattices; Measurement uncertainty; Optical interferometry; Silicon; Steel; Temperature; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.918198
  • Filename
    918198