Contingency ranking for voltage collapse via sensitivities from a single nose curve

Author

Greene, Scott ; Dobson, Ian ; Alvarado, Fernando L.

Author_Institution

Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA

Volume

14

Issue

1

fYear

1999

fDate

2/1/1999 12:00:00 AM

Firstpage

232

Lastpage

240

Abstract

The change in the loading margin to voltage collapse when line outages occur is estimated. First a nose curve is computed by continuation to obtain a nominal loading margin. Then linear and quadratic sensitivities of the loading margin to each contingency are computed and used to estimate the resulting change in the loading margin. The method is tested on a critical area of a 1390 bus system and all the line outages of the IEEE 118 bus system. The results show the effective ranking of contingencies and the very fast computation of the linear estimates

Keywords

bifurcation; power system dynamic stability; power system security; sensitivity analysis; 1390 bus system; IEEE 118 bus system; bifurcation; contingency ranking; dynamic stability; line outages; linear estimates computation; linear sensitivites; load margin sensitivites; power system security; quadratic sensitivities; single nose curve; voltage collapse; voltage stability; Admittance; Nose; Power & Energy Society; Power system dynamics; Power system stability; Power system transients; Printing; Reactive power; Security; Voltage;

fLanguage

English

Journal_Title

Power Systems, IEEE Transactions on

Publisher

ieee

ISSN

0885-8950

Type

jour

DOI

10.1109/59.744538

Filename

744538