DocumentCode
1471825
Title
Theoretical study of the temperature dependence of 1.3-μm AlGaInAs-InP multiple-quantum-well lasers
Author
Pan, Jen-Wei ; Chyi, Jen-Inn
Author_Institution
Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Volume
32
Issue
12
fYear
1996
fDate
12/1/1996 12:00:00 AM
Firstpage
2133
Lastpage
2138
Abstract
The temperature dependence of the differential gain, carrier density, and transparency current density for 1.3-μm AlGaInAs-InP multiple-quantum-well lasers has been theoretically studied using the optical gain calculation from 250-380 K. The characteristic temperatures of the carrier density and differential gain at threshold are calculated to be 254 and 206 K, respectively. The Auger current density accounts for more than 50% of the total current density. The leakage current density exhibits the highest temperature sensitivity and becomes an essential part of the total current density at a high temperature. The calculated characteristic temperatures of the transparency and threshold current densities are 106 and 84 K, respectively, which agree well with the reported experimental results
Keywords
III-V semiconductors; aluminium compounds; current density; gallium arsenide; indium compounds; infrared sources; laser theory; laser transitions; quantum well lasers; sensitivity; transparency; μm AlGaInAs-InP multiple-quantum-well lasers; 1.3 mum; 106 K; 206 K; 250 to 380 K; 254 K; 84 K; AlGaInAs-InP; AlGaInAs-InP multiple-quantum-well lasers; Auger current density; carrier density; characteristic temperatures; differential gain; high temperature; highest temperature sensitivity; leakage current density; optical gain calculation; temperature dependence; theoretical study; threshold; threshold current densities; total current density; transparency; transparency current density; Charge carrier density; Current density; Free electron lasers; Laser theory; Leakage current; Optical materials; Quantum well devices; Radiative recombination; Temperature dependence; Temperature sensors;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.544760
Filename
544760
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