DocumentCode :
1472072
Title :
Parameter Estimation of a Synchronous Generator Using a Sine Cardinal Perturbation and Mixed Stochastic–Deterministic Algorithms
Author :
Arjona, M.A. ; Cisneros-González, M. ; Hernández, C.
Author_Institution :
Div. de Estudios de Posgrado e Investig., Inst. Tecnol. de la Laguna, Torreón, Mexico
Volume :
58
Issue :
2
fYear :
2011
Firstpage :
486
Lastpage :
493
Abstract :
Parameter estimation of synchronous generators has been a topic of interest of many investigators for several decades. Different ratings of synchronous machines have been used, and they vary from fractional to hundreds of megawatts. Several time-domain tests have been proposed, along with their implementation methodology, over the years. Those tests have had different impacts on the synchronous machine; some of them are applied when the machine is at a standstill, while others are applied when the machine is online. This paper deals with the application of a novel standstill time-domain test, which is based on the application of a sine cardinal perturbation, for estimating the parameters of the electrical d-q-axis equivalent circuits of a synchronous generator. The set of fundamental parameters for a 7-kVA 1800-r/min 60-Hz salient-pole wye-connected synchronous generator is obtained using a genetic algorithm, and the resulting model is validated against a sudden three-phase short-circuit test.
Keywords :
genetic algorithms; power system parameter estimation; stochastic processes; synchronous generators; apparent power 7 kVA; electrical d-q axis equivalent circuit; frequency 60 Hz; genetic algorithm; mixed stochastic deterministic algorithm; parameter estimation; salient pole wye-connected synchronous generator; sine cardinal perturbation; synchronous machine; three phase short circuit test; time-domain test; AC generator; data acquisition; genetic algorithms (GAs); identification; least squares; modeling; nonlinear estimation; parameter estimation; synchronous generator;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2010.2047833
Filename :
5447641
Link To Document :
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