• DocumentCode
    1472085
  • Title

    GaAs-Based Transverse Junction Superluminescent Diodes With Strain-Compensated InGaAs–GaAsP Multiple-Quantum-Wells at 1.1- \\mu m Wavelength

  • Author

    Guol, Shi-Hao ; Chou, Ming-Ge ; Yang, Ying-Jay ; Sun, Chi-Kuang ; Shi, Jin-Wei

  • Author_Institution
    Grad. Inst. of Photonics & Optoelectron., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    22
  • Issue
    12
  • fYear
    2010
  • fDate
    6/15/2010 12:00:00 AM
  • Firstpage
    917
  • Lastpage
    919
  • Abstract
    In this study, we demonstrate a transverse junction superluminescent diode (TJ-SLD) with an engagement of chirped InxGa1-xAs-GaAs0.9P0.1 strain-compensated multiple-quantum-wells (SC MQWs) at 1.1-μm wavelength. The problem relative to inhomogeneous carrier distribution in each QW, which is a problem in traditional vertical junction SLDs (VJ-SLDs), can be effectively minimized by utilizing the benefit of lateral carrier injection in TJ devices. Our demonstrated device offers significant improvements in threshold current, output power, and optical bandwidths compared to TJ-SLD without SC MQWs. Furthermore, compared with the high-performance ~1-μm VJ-SLDs, this novel device exhibits a comparable output power and 3-dB bandwidth performance with a more stable electroluminescence spectrum, which varies only negligibly under a wide range of bias current.
  • Keywords
    III-V semiconductors; electroluminescence; gallium arsenide; gallium compounds; indium compounds; quantum well devices; semiconductor epitaxial layers; superluminescent diodes; GaAs; GaAs-based transverse junction superluminescent diodes; InxGa1-xAs-GaAs0.9P0.1; chirped strain-compensated multiple-quantum-wells; inhomogeneous carrier distribution; lateral carrier injection; optical bandwidth; output power; stable electroluminescence spectrum; threshold current; wavelength 1.1 mum; Amplified spontaneous emission (ASE); strain compensation; superluminescent diodes (SLDs);
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2010.2047637
  • Filename
    5447643