Title :
Fast split background calibration for pipelined ADCs enabled by slope mismatch averaging technique
Author :
Adel, Heike ; Louerat, Marie-Minerve ; Sabut, Marc
Author_Institution :
LIP6 Lab., Univ. Pierre & Marie Curie, Paris, France
Abstract :
A slope mismatch averaging technique which reduces the calibration time and simplifies the digital calibration circuitry in split ADC calibration is introduced. The technique is a direct operation to perform split ADC calibration in pipelined analogue-to-digital converters (ADCs) without any feedback, thus achieving a significant reduction in calibration time.
Keywords :
analogue-digital conversion; calibration; pipeline processing; calibration time; digital calibration circuitry; pipelined ADC; pipelined analogue-to-digital converter; slope mismatch averaging technique; split ADC calibration; split background calibration;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2012.0357