Title :
A study of the robustness of pseudorandom binary-array-based surface characterization
Author :
Spoelder, Hans J W ; Vos, Franciscus M. ; Petriu, Emil M. ; Croen, F.C.A.
Author_Institution :
Dept. of Phys. & Astron., Vrije Univ., Amsterdam, Netherlands
fDate :
8/1/1998 12:00:00 AM
Abstract :
In this paper me report on aspects of the use of color-coded pseudorandom binary arrays (PRBA´s) to model three-dimensional scenes. We evaluate the accuracy and the robustness of the pattern recognition phase in the process. Emphasis is on the added value of the use of PRBA´s as a tool to make the image processing robust and highly noise insensitive
Keywords :
binary sequences; image reconstruction; medical image processing; pattern recognition; added value; biomedical image processing; noise insensitive processing; pattern recognition phase; pseudorandom binary-array-based surface characterization; robustness; three-dimensional scenes; Astronomy; Binary sequences; Image processing; Image reconstruction; Layout; Noise robustness; Optical noise; Physics; Shape measurement; Vectors;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
