• DocumentCode
    1472270
  • Title

    Path Criticality Computation in Parameterized Statistical Timing Analysis Using a Novel Operator

  • Author

    Chung, Jaeyong ; Xiong, Jinjun ; Zolotov, Vladimir ; Abraham, Jacob A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Texas, Austin, TX, USA
  • Volume
    31
  • Issue
    4
  • fYear
    2012
  • fDate
    4/1/2012 12:00:00 AM
  • Firstpage
    497
  • Lastpage
    508
  • Abstract
    This paper presents a method to compute criticality probabilities of paths in parameterized statistical static timing analysis. We partition the set of all the paths into several groups and formulate the path criticality into a joint probability of inequalities. Before evaluating the joint probability directly, we simplify the inequalities through algebraic elimination, handling topological correlation. Our proposed method uses conditional probabilities to obtain the joint probability, and statistics of random variables representing process parameters are changed to take into account the conditions. To calculate the conditional statistics of the random variables, we derive analytic formulas by extending Clark´s work. This allows us to obtain the conditional probability density function of a path delay, given the path is critical, as well as to compute criticality probabilities of paths. Our experimental results show that the proposed method provides 4.2X better accuracy on average in comparison to the state-of-art method.
  • Keywords
    critical path analysis; network topology; statistical analysis; timing circuits; algebraic elimination; joint probability of inequalities; path criticality computation; path delay; state of art method; statistical static timing analysis; topological correlation; Accuracy; Correlation; Delay; Joints; Random variables; Conditioning operation; criticality; statistical maximum; statistical timing analysis;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2011.2179042
  • Filename
    6171046