• DocumentCode
    1472855
  • Title

    Fractal Power Network Based on Plant Vein for Power Integrity

  • Author

    Huang, Hui-Fen ; Chu, Qing-Xin ; Xiao, Jian-Kang

  • Author_Institution
    Sch. of Electron. & Inf. Eng., South China Univ. of Technol., Guangzhou, China
  • Volume
    52
  • Issue
    3
  • fYear
    2010
  • Firstpage
    759
  • Lastpage
    762
  • Abstract
    In this paper, a fractal power network has been proposed. The structure is designed based on leaf vein. The simulated and measured results illustrate that the designed power network has greatly improved noise isolation, resistive and inductive voltage drop, and “Swiss Cheese” effect.
  • Keywords
    fractals; integrated circuit interconnections; Swiss cheese effect; fractal power network; inductive voltage drop; leaf vein; noise isolation; plant vein; power integrity; Attenuation; Chromium; Circuit noise; Conductivity; Dairy products; Finite difference methods; Fractals; Noise measurement; Periodic structures; Power cables; Power measurement; Programmable control; Semiconductivity; Semiconductor device measurement; Signal processing; Tree data structures; Veins; Voltage; “Swiss cheese” effect; Fractal; power integrity (PI); voltage drop;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2010.2046643
  • Filename
    5447788