• DocumentCode
    1472981
  • Title

    Feature extraction from wavelet coefficients for pattern recognition tasks

  • Author

    Pittner, Stefan ; Kamarthi, Sagar V.

  • Author_Institution
    Dept. of Mech., Ind. & Manuf. Eng., Northeastern Univ., Boston, MA, USA
  • Volume
    21
  • Issue
    1
  • fYear
    1999
  • fDate
    1/1/1999 12:00:00 AM
  • Firstpage
    83
  • Lastpage
    88
  • Abstract
    An efficient feature extraction method based on the fast wavelet transform is presented. The paper especially deals with the assessment of process parameters or states in a given application using the features extracted from the wavelet coefficients of measured process signals. Since the parameter assessment using all wavelet coefficients will often turn out to be tedious or leads to inaccurate results, a preprocessing routine that computes robust features correlated to the process parameters of interest is highly desirable. The method presented divides the matrix of computed wavelet coefficients into clusters equal to row vectors. The rows that represent important frequency ranges (for signal interpretation) have a larger number of clusters than the rows that represent less important frequency ranges. The features of a process signal are eventually calculated by the Euclidean norms of the clusters. The effectiveness of this new method has been verified on a flank wear estimation problem in turning processes and on a problem of recognizing different kinds of lung sounds for diagnosis of pulmonary diseases
  • Keywords
    feature extraction; process monitoring; signal classification; wavelet transforms; Euclidean norms; flank wear estimation; lung sounds; pattern recognition tasks; preprocessing routine; pulmonary diseases; signal interpretation; turning processes; wavelet coefficients; Data mining; Discrete wavelet transforms; Feature extraction; Frequency; Pattern recognition; Signal processing; Turning; Wavelet analysis; Wavelet coefficients; Wavelet transforms;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.745739
  • Filename
    745739