Title :
Minimize Production Loss in Device Testing via Condition-Based Equipment Maintenance
Author :
Jin, Tongdan ; Mechehoul, Mahmoud
Author_Institution :
Ingram Sch. of Eng., Texas State Univ., San Marcos, TX, USA
Abstract :
A condition-based maintenance program is proposed to reduce the device testing cost by utilizing tester´s self-diagnostic data. The degradation signal is modeled as a nonstationary Gaussian process with time-varying mean and variance. Based on the degradation model, an optimization algorithm is devised to determine the best maintenance policy such that production loss due to equipment failures is minimized. Simulations and numerical examples are provided to demonstrate the performance of the method.
Keywords :
Gaussian processes; maintenance engineering; optimisation; testing; best maintenance policy; condition-based equipment maintenance; condition-based maintenance program; degradation model; degradation signal; device testing cost; equipment failure; nonstationary Gaussian process; optimization algorithm; production loss; self-diagnostic data; time-varying mean; Automatic testing; Cost function; Degradation; Fabrication; Gaussian processes; Intelligent sensors; Lean production; Numerical simulation; Semiconductor device manufacture; Signal processing; Condition-based maintenance (CBM); electronics prognostics; nonstationary Gaussian process; remaining useful life;
Journal_Title :
Automation Science and Engineering, IEEE Transactions on
DOI :
10.1109/TASE.2010.2046164
