• DocumentCode
    1473049
  • Title

    A microprocessor-based dual slope phase meter

  • Author

    Mahmud, S.M. ; Rusek, Andrzej ; Ganesan, Subramaniam

  • Author_Institution
    Sch. of Eng. & Comput. Sci., Oakland Univ., Rochester, MI, USA
  • Volume
    37
  • Issue
    3
  • fYear
    1988
  • fDate
    9/1/1988 12:00:00 AM
  • Firstpage
    374
  • Lastpage
    378
  • Abstract
    A dual-slope phase meter has been designed and tested to investigate its limitations. The design does not require a time standard; it offers good resolution, relative simplicity, low sensitivity to changes of internal circuit parameters, and microprocessor compatibility. The idea is based on a single-slope approach demonstrated by W.T. Davis (1986), but several disadvantages of the system have been eliminated. The main problem with the system, relating to the error due to the finite time of sampling, is discussed
  • Keywords
    computerised instrumentation; measurement errors; microcomputer applications; phase meters; computerised instrumentation; dual slope phase meter; error; finite time of sampling; microprocessor compatibility; Capacitors; Circuit testing; Frequency; Helium; Instruments; Measurement standards; Microprocessors; Signal generators; Time measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.7458
  • Filename
    7458